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Takaya - Fixtureless Flying Probe Tester
Flying probe test system is used for detection of manufacturing defects on assembled printed circuit boards by using high speed independently moving probes, thus removing the requirement for a conventional bed-of-nails fixture.
Takaya pioneered the concept of flying probe tester combining advanced test techniques and precision mechanical system. Since then Takaya has been a market leader for flying probes test system as it has focused its research and development resources on getting to the rapidly changing technological requirements and catering to the ever changing user needs.
Takaya has an installed base of more than 1.500 flying probe test systems in major EMS (Electronic manufacturing service) and CM (contract manufacturing) plants in over
40 countries.
Prominent features of Takaya Flying probe Tester
- Lowering the testing costs.
- Easy access to fine pitch SMT devices.
- Quality improvement of production lines.
- Fast probe movement, reduces test time.
- Accurate, comprehensive test coverage and stress less probe contact.
- Detect unsoldered IC leads.
- Easy maintenance.
- Easy & user friendly programming software.
User-friendly expandability of test capabilities.
FIXTURELESS TESTER APT – 9411 CE

- Four independently moving probes.
- Can be expanded for Boundary scan testing.
- An in-line can be built -to-order to establish full automatic operation in production line.
- Automatic conveyor width adjustment.
- Maximum PCB testable area 540 * 460mm (21*18).
- Minimum probe contact pitch 0.2 (8mil) in use of needle probes.
- Minimum probe contact pad size 120 –150um (5- 6mil), in use of needle probes.
Can be expanded for power ON test using programmable DC power supply board
FIXTURELESS TESTER APT – 820S

- Two independently moving probes.
- Is reliable, versatile, precise and fast.
- An in -line can be built-to-order to establish full automatic operation in production line.
- Small size and superior cost performance.
- Minimum PCB testable area 330*255mm (13’*10’).
- Maximum probe contact pitch 0.2 (8mil) in use of needle probes.
- Minimum probe contact pad size 80- 100um (3.2 - 4mil), in use of needle probes.
- Air supply of 0.6 to 0.7Mpa dry clean air is required
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